A good way to see where this article is headed is to take a look at the screenshot in Figure 1 and the graph in Figure 2. The demo program begins by loading a tiny 10-item dataset into memory. The ...

Comparing die test results with other die on a wafer helps identify outliers, but combining that data with the exact location of an outlier offers a much deeper understanding of what can go wrong and ...

The next wave of automotive chips for assisted and autonomous driving is fueling the development of new approaches in a critical field called outlier detection. KLA-Tencor, Optimal+, as well as Mentor ...